SEMTest is a configurable stress-screening system that performs accelerated lifetime testing of power semiconductors and modules incorporating IGBT, MOSFET, SCR, diode and bipolar parts. The system is ideal for both manufacturers and users of power semiconductors who want to qualify commercial off the shelf devices for use in high reliability applications found in automotive, transportation, aerospace, defense, industrial, and medical systems.
The core of SEMTest is a flexible architecture that can configured to each customer’s unique test requirements. Systems can be configured from 20 to 4000 test cells and larger. Each cell features its own local controller to set and monitor either applied or UUT (unit under test) power and other test parameters. Each cell also has a measurement unit for temperature, current, voltage, and timing making it possible for complete characterization and production tests to accelerate failure mechanisms of individual devices and determine functional operating limits.
- Power cycling for thermal and electrical stressing of devices under test
- Trend monitoring with user defined warning and control limits
- Rapid device temperature cycling & ambient temperature profiling
- Measuring junction temperatures
- Detecting nascent failures and automatically sending alerts
Test configurations are quickly programmed through a user-friendly graphical user interface. Setups and measures for each test cell are displayed on the screen and output into a SQL database for fast in-test and post-test analysis.
Sample power semiconductor test systems